An Embedded Rectifier-Based Built-In-Test Circuit for CMOS RF Circuits

Built-in-test (BIT) for radio frequency integrated circuits (RFIC) is an effective method to reduce the testing cost, especially with the increase of integration level and operating frequency. In this work, a fully integrated CMOS BIT methodology is proposed. The BIT circuit used is rectifier-based and gate-source connected MOS transistor with substrate positively-biased (SPB) scheme is used to further improve the detecting sensitivity. With little current consumption, high input impedance and high frequency scalability this circuit can predict complex high frequency performances of RF circuits such as gain, operating frequency, bandwidth and linearity. Besides, the influence of process, supply voltage, and temperature (PVT) variations on the performance of RF circuits can also be monitored by using this BIT circuit.

[1]  K. Cheng,et al.  A BIST scheme for on-chip ADC and DAC testing , 2000, Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537).

[2]  Abhijit Chatterjee,et al.  Built-in test of RF components using mapped feature extraction sensors , 2005, 23rd IEEE VLSI Test Symposium (VTS'05).

[3]  Abhijit Chatterjee,et al.  Feature extraction based built-in alternate test of RF components using a noise reference , 2004, 22nd IEEE VLSI Test Symposium, 2004. Proceedings..

[4]  Alberto Valdes-Garcia,et al.  A CMOS RF RMS detector for built-in testing of wireless transceivers , 2005, 23rd IEEE VLSI Test Symposium (VTS'05).

[5]  Abhijit Chatterjee,et al.  Robust Built-In Test of RF ICs Using Envelope Detectors , 2005, 14th Asian Test Symposium (ATS'05).

[6]  D.C. Doskocil.  Advanced RF built in test , 1992, Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference.

[7]  Chujen Lin,et al.  Automatic BIST design tool for mixed-signal circuits , 1998, 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179).

[8]  François Krummenacher,et al.  A model for /spl mu/-power rectifier analysis and design , 2005, IEEE Transactions on Circuits and Systems I: Regular Papers.

[9]  Abhijit Chatterjee,et al.  Use of embedded sensors for built-in-test RF circuits , 2004 .

[10]  Wai Yuen Lau.  Measurement challenges for on-wafer RF-SOC test , 2002, 27th Annual IEEE/SEMI International Electronics Manufacturing Technology Symposium.