AUTOCALIBRATION OF SILICON HALL DEVICES

Abstract A new method for eliminating sensor defects is presented. The autocalibration method uses an on-chip actuator that generates a reference signal to correct the sensor characteristics, ensuring reliable and accurate measurements. Autocalibration also eliminates the need for calibration during manufacturing or during the lifetime of the sensor, which considerably reduces the cost of mass-produced sensors. The on-chip actuator also provides the user with diagnostic information by providing a self-test feature. To illustrate the effectiveness of this method, the principle is successfully applied to a silicon Hall device, which is known for its unstable sensitivity.