论文信息 - Focused helium ion beam milling and deposition - 字舞流文

Focused helium ion beam milling and deposition

H. Mizuta | Z. Moktadir | S. Boden | H. Rutt | D. Bagnall

[1] M. M. Lucchese,et al. Quantifying ion-induced defects and Raman relaxation length in graphene , 2010 .

[2] Erik Dujardin,et al. Side-gated transport in focused-ion-beam-fabricated multilayered graphene nanoribbons. , 2007, Small.

[3] Nicholas P. Economou,et al. Helium ion microscope: A new tool for nanoscale microscopy and metrology , 2006 .

[4] Pablo Jarillo-Herrero,et al. Etching of graphene devices with a helium ion beam. , 2009, ACS nano.

[5] C. Marcus,et al. Precision material modification and patterning with He ions , 2009 .

[6] G. Fudenberg,et al. Ultrahigh electron mobility in suspended graphene , 2008, 0802.2389.

[7] Louise S. Barriss,et al. Beam induced deposition of platinum using a helium ion microscope , 2009 .

[8] M. Rooks,et al. Graphene nano-ribbon electronics , 2007, cond-mat/0701599.

[9] Paul Alkemade,et al. Nanofabrication with a helium ion microscope , 2010, Advanced Lithography.

[10] Nan Yao,et al. Superior imaging resolution in scanning helium-ion microscopy: A look at beam-sample interactions , 2008 .

[11] A. Ouerghi,et al. Deposition and FIB direct patterning of nanowires and nanorings into suspended sheets of graphene , 2009 .

[12] C. Marcus,et al. Precision cutting and patterning of graphene with helium ions , 2009, Nanotechnology.

[13] C. Stampfer,et al. Tunable Coulomb blockade in nanostructured graphene , 2007, 0709.3799.