Characterization of surface exchange reactions used to grow compound films

Sequential surface exchange reations have been provoked by means of an atomic layer epitaxy (ALE) method to grow Ta2O5 and ZnS films from vapor phases of TaCl5 (ZnCl2) and H2O (H2S) reactants. The growth mechanism has been explained. The films were studied by using Auger electron spectroscopy, scanning electron microscopy, and x‐ray diffraction.