The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis
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A. Lindoso | L. Entrena | M. Garcia-Valderas | M. Peña-Fernandez | A. Lindoso | L. Entrena | M. García-Valderas | M. Peña-Fernandez
[1] D. Brenner,et al. An accelerator-based neutron microbeam system for studies of radiation effects. , 2011, Radiation protection dosimetry.
[2] Rajshree Shau. Troubleshooting Microprocessor Based System using An Object Oriented Expert System , 2011 .
[3] Todd M. Austin,et al. A Systematic Methodology to Compute the Architectural Vulnerability Factors for a High-Performance Microprocessor , 2003, MICRO.
[4] Yong Kim,et al. Real-Time Fault Detection and Diagnostics Using FPGA-based Architectures , 2010, 2010 International Conference on Field Programmable Logic and Applications.
[5] Y. Morilla,et al. Evaluation of the Suitability of NEON SIMD Microprocessor Extensions Under Proton Irradiation , 2018, IEEE Transactions on Nuclear Science.
[6] H. Guzman-Miranda,et al. Real time SEU detection and diagnosis for safety or mission-critical ICs using HASH library-based fault dictionaries , 2011, 2011 12th European Conference on Radiation and Its Effects on Components and Systems.
[7] Mehdi Baradaran Tahoori,et al. Vulnerability Analysis of L2 Cache Elements to Single Event Upsets , 2006, Proceedings of the Design Automation & Test in Europe Conference.
[8] Y. Morilla,et al. Online Error Detection Through Trace Infrastructure in ARM Microprocessors , 2019, IEEE Transactions on Nuclear Science.
[9] F. W. Sexton,et al. Microbeam studies of single-event effects , 1996 .
[10] Mehdi Baradaran Tahoori,et al. A Field Analysis of System-level Effects of Soft Errors Occurring in Microprocessors used in Information Systems , 2008, 2008 IEEE International Test Conference.
[12] Fan Tongshun,et al. Research for digital circuit fault testing and diagnosis techniques , 2009, 2009 International Conference on Test and Measurement.
[13] Farokh Irom,et al. Single-event upset in the PowerPC750 microprocessor , 2001 .
[14] Biplab K. Sikdar,et al. Fault diagnosis of VLSI circuits with cellular automata based pattern classifier , 2005, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[15] Sule Ozev,et al. Online diagnosis of hard faults in microprocessors , 2007, TACO.
[16] V. Pouget,et al. Pulsed-Laser Testing for Single-Event Effects Investigations , 2013, IEEE Transactions on Nuclear Science.
[17] S. Rezgui,et al. Predicting error rate for microprocessor-based digital architectures through C.E.U. (Code Emulating Upsets) injection , 2000 .
[18] Raoul Velazco,et al. An Automated SEU Fault-Injection Method and Tool for HDL-Based Designs , 2013, IEEE Transactions on Nuclear Science.
[19] M. A. Aguirre,et al. Metrics for the Measurement of the Quality of Stimuli in Radiation Testing Using Fast Hardware Emulation , 2013, IEEE Transactions on Nuclear Science.