论文信息 - Investigation of methods to enhance the secondary ion yields in TOF‐SIMS of organic samples - 字舞流文

Investigation of methods to enhance the secondary ion yields in TOF‐SIMS of organic samples

D. Lipinsky | H. Arlinghaus | P. Bertrand | A. Delcorte | P. Van Royen | J. Pireaux | R. De Mondt | L. Van Vaeck | L. Houssiau | N. Wehbe | A. Heile | A. Felten