Demonstration of low-knee voltage high-breakdown GaInP double HBTs using novel compound collector design
暂无分享,去创建一个
[1] H. Kroemer,et al. Heterojunction bipolar transistor using a (Ga,In)P emitter on a GaAs base, grown by molecular beam epitaxy , 1985, IEEE Electron Device Letters.
[2] Mau-Chung Frank Chang,et al. III-V HETEROJUNCTION BIPOLAR TRANSISTORS FOR HIGH-SPEED APPLICATIONS , 1990 .
[3] Ming C. Wu,et al. Carbon-doped InGaP/GaAs/InGaP Double Heterojunction Bipolar Transistors , 1992, 50th Annual Device Research Conference.
[4] C. Caneau,et al. GaInP/GaAs double heterojunction bipolar transistor with high f/sub T/, f/sub max/, and breakdown voltage , 1994, IEEE Electron Device Letters.
[5] A. Hanson. Analysis of and process development for high-frequency indium gallium phosphide/gallium arsenide heterojunction bipolar transistors , 1994 .
[6] Taisuke Iwai,et al. High-reliability InGaP/GaAs HBTs fabricated by self-aligned process , 1994, Proceedings of 1994 IEEE International Electron Devices Meeting.
[7] Y. F. Yang,et al. Carbon doped GaInP/GaAs double heterostructure-emitter bipolar transistors with high current gain , 1995 .
[8] D. A. Ahmari,et al. Effect of collector design on the d.c. characteristics of heterojunction bipolar transistors , 1995 .
[9] D. A. Ahmari,et al. InGaP/GaAs HBT with novel layer structure for emitter ledge fabrication , 1996, International Electron Devices Meeting. Technical Digest.
[10] N. Pan,et al. High reliability InGaP/GaAs HBT , 1998, IEEE Electron Device Letters.
[11] N. Pan,et al. Migration from an AlGaAs to an InGaP emitter HBT IC process for improved reliability , 1998, GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 20th Annual. Technical Digest 1998 (Cat. No.98CH36260).