High-Resolution Transmission Electron Microscopy of Planar Defects in Ca-Doped YBCO/(l–2–4) High-Tc Superconductors Y1−x CaxBa2Cu4Oy (x = 0 to 0.1)
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Y. Matsui | F. Izumi | S. Horiuchi | Y. Kodama | Takehiko Matsumoto | S. Ikeda | Y. Yamada | K. Yanagisawa