Prospects of application to the French system of fast methods for transient stability and voltage security assessment
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Louis Wehenkel | Thierry Van Cutsem | Mania Pavella | Y. Xue | Edwige Euxibie | Bertrand Heilbronn | Michel Goubin | L. Wehenkel | Y. Xue | T. Cutsem | B. Heilbronn | E. Euxibie | M. Pavella | Michel Goubin