High-Speed Digital Double Sampling with Analog CDS on Column Parallel ADC Architecture for Low-Noise Active Pixel Sensor

A progressive 1/1.8-inch 1920times1440 CMOS image sensor with a column-inline dual CDS architecture uses a 0.18mum CMOS process. This sensor implements digital double sampling with analog CDS on a column parallel ADC. Random noise is 5.2e-rms and the DR is 68dB at 180frames/s(6.0Gb/s). FPN is <0.5e-rms without the correction circuit

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