Deposition pressure dependent structural and optoelectronic properties of ex-situ boron-doped poly-Si/SiOx passivating contacts based on sputtered silicon
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D. Macdonald | A. Cuevas | Hieu T. Nguyen | H. Guthrey | Wenhao Chen | M. Al‐Jassim | D. Yan | Wenjie Wang | T. Truong