A current sensing circuit for feedback bridging faults
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[1] John M. Acken. Testing for Bridging Faults (Shorts) in CMOS Circuits , 1983, 20th Design Automation Conference Proceedings.
[2] Yukiya Miura,et al. A built-in I/sub DDQ/ test circuit utilizing upper and lower limits , 1994, Proceedings of IEEE 3rd Asian Test Symposium (ATS).
[3] Kuen-Jong Lee,et al. A practical current sensing technique for IDDQ testing , 1995, IEEE Trans. Very Large Scale Integr. Syst..
[4] Shiyi Xu,et al. Detecting I/O and Internal Feedback Bridging Faults , 1985, IEEE Transactions on Computers.
[5] Miquel Roca,et al. Current testability analysis of feedback bridging faults in CMOS circuits , 1995, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[6] Charles F. Hawkins,et al. Quiescent power supply current measurement for CMOS IC defect detection , 1989 .
[7] Wojciech Maly,et al. Built-in current testing-feasibility study , 1988, [1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers.
[8] Jien-Chung Lo,et al. A 2-ns detecting time, 2- mu m CMOS built-in current sensing circuit , 1993 .
[9] Kozo Kinoshita,et al. CIRCUIT DESIGN FOR BUILT-IN CURRENT TESTING , 1992, Proceedings International Test Conference 1992.