Detection of sub-pixel fractures in X-ray dark-field tomography

Abstract We present a new method for detecting fractures in solid materials below the resolution given by the detector pixel size by using grating-based X-ray interferometry. The technique is particularly useful for detecting sub-pixel cracks in large samples where the size of the sample is preventing high-resolution μCT studies of the entire sample. The X-ray grating interferometer produces three distinct modality signals: absorption, phase and dark field. The method utilizes the unique scattering features of the dark-field signal. We have used tomograms reconstructed from each of the three signals to detect cracks in a model sample consisting of stearin.

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