Sine-fit versus DFT-based algorithms in SNR testing of waveform digitizers

An analysis is given of the performances of DFT-based algorithms employed in SNR testing of digitizers, compared to sine-fit procedures.

[1]  A. van den Bos.  Estimation of Fourier coefficients , 1989 .

[2]  Dario Petri,et al.  A/D converter performance analysis by a frequency domain approach , 1992, [1992] Conference Record IEEE Instrumentation and Measurement Technology Conference.

[3]  Dario Petri,et al.  Optimized sinewave test of waveform digitizers by a DFT approach , 1996 .