论文信息 - On-Wafer Measurement of Transistor Noise Parameters at NIST

On-Wafer Measurement of Transistor Noise Parameters at NIST

The National Institute of Standards and Technology has developed the capability to measure noise parameters on a wafer in the 1-12.4-GHz range. The authors describe the measurement method and the uncertainty analysis and present results of measurements on a highly reflective transistor. Typical standard uncertainties are within the range of 20-25 K in Tmin, which is the minimum transistor noise temperature, and about 0.03 in the magnitude of Gammaopt, which is the reflection coefficient for which Tmin occurs

David K. Walker | James Randa

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