论文信息 - Measurement of MOSFET constants

Measurement of MOSFET constants

A method is described to electrically determine MOSFET channel length, mobility, gate-bias dependence and parasitic series resistance. These four quantities are obtained by curve fitting output resistance measurements over a range of gate biases and channel lengths. Measurements from two gate biases on each of two devices of different channel lengths are sufficient to obtain a full characterization. Thus, the method is well suited for automated testing because of its simplicity and efficiency.

F.H. De La Moneda | H.N. Kotecha | M. Shatzkes

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