论文信息 - Feasibility of IDDQ Tests for Shorts in Deep Submicron ICs

Feasibility of IDDQ Tests for Shorts in Deep Submicron ICs

Quiescent supply current(IDDQ) in deep submicron ICs is derived by circuit simulation and feasibility of IDDQ tests is examined for short defects in ICs fabricated with 0.18㎛ CMOS process. The results show that IDDQ of each gate depends on input logic values and that shorts can be detected by IDDQ testing if some process variations are small.

Masaki Hashizume | Hiroyuki Yotsuyanagi | Isao Tsukimoto

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