Some thoughts about scanning probe microscopy, micromechanics, and storage

[1]  G. Whitesides,et al.  Scanning Force Microscopies Can Image Patterned Self-Assembled Monolayers , 1995 .

[2]  N. D. Rooij,et al.  Microlever with combined integrated sensor/actuator functions for scanning force microscopy , 1994 .

[3]  Fischer Uc,et al.  Observation of single-particle plasmons by near-field optical microscopy. , 1989 .

[4]  Y. Martin,et al.  Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution , 1987 .

[5]  M. T. Gale.  Diffractive microstructures for security applications , 1991 .

[6]  Dieter Weller,et al.  Scanning near‐field optical microscope for the imaging of magnetic domains in optically opaque materials , 1994 .

[7]  D. Pohl,et al.  “Tunnel” Near-Field Optical Microscopy: TNOM-2 , 1995 .

[8]  C. F. Quate,et al.  Large-scale charge storage by scanning capacitance microscopy , 1992 .

[9]  G. Binnig,et al.  Single-tube three-dimensional scanner for scanning tunneling microscopy , 1986 .

[10]  Calvin F. Quate,et al.  Microfabrication of cantilever styli for the atomic force microscope , 1990 .

[11]  W. Denk,et al.  Optical stethoscopy: Image recording with resolution λ/20 , 1984 .

[12]  Calvin F. Quate,et al.  Atomic force microscope lithography using amorphous silicon as a resist and advances in parallel operation , 1995 .

[13]  H. van Kempen,et al.  Applications of a high-stability scanning tunneling microscope , 1986, IBM J. Res. Dev..

[14]  Daniel Rugar,et al.  Thermomechanical data storage using a fiber optic stylus , 1994 .

[15]  S. Iwamura,et al.  Rotating MNOS disk memory device , 1981, IEEE Transactions on Electron Devices.

[16]  Dieter W. Pohl,et al.  Near‐field optical scanning microscopy in reflection , 1988 .

[17]  D. Pohl,et al.  Scanning near-field optical probe with ultrasmall spot size. , 1995, Optics letters.

[18]  U. Dürig,et al.  Near‐field optical‐scanning microscopy , 1986 .

[19]  John Clarke,et al.  Surface modification with the scanning tunneling microscope , 1986, IBM J. Res. Dev..

[20]  Self-excited Force Sensing Microcantilevers With Piezoelectric Thin Films For Dynamic Scanning Force Microscopy , 1995, Proceedings of the International Solid-State Sensors and Actuators Conference - TRANSDUCERS '95.

[21]  Dieter W. Pohl,et al.  Some design criteria in scanning tunneling microscopy , 1986, IBM J. Res. Dev..

[22]  Daniel Rugar,et al.  TIP-BASED DATA STORAGE USING MICROMECHANICAL CANTILEVERS , 1995 .

[23]  D. Rugar,et al.  Thermomechanical writing with an atomic force microscope tip , 1992 .

[24]  Rino E. Kunz,et al.  Replicated microstructures for integrated optics , 1994, Integrated Optoelectronics.

[25]  Calvin F. Quate,et al.  Charge storage in a nitride‐oxide‐silicon medium by scanning capacitance microscopy , 1991 .

[26]  M. Kryder,et al.  Near‐field magneto‐optics and high density data storage , 1992 .

[27]  S. Akamine,et al.  Microfabricated scanning tunneling microscope , 1989, IEEE Electron Device Letters.

[28]  R. Barrett,et al.  Data storage in NOS: lifetime and carrier-to-noise measurements , 1995 .

[29]  P Muralt,et al.  Wide-range, low-operating-voltage, bimorph STM: Application as potentiometer , 1986, IBM J. Res. Dev..

[30]  K.E. Petersen,et al.  Silicon as a mechanical material , 1982, Proceedings of the IEEE.

[31]  D. Rugar,et al.  Atomic emission from a gold scanning-tunneling-microscope tip. , 1990, Physical review letters.