Enhanced electric resistivity and dielectric energy storage by vacancy defect complex
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Qinghua Zhang | Yang Shen | Yuanhua Lin | C. Nan | J. MacManus‐Driscoll | Weiwei Li | Xiao Renshaw Wang | Jing Ma | K. Bi | Chonglin Chen | Ben Xu | Lin Gu | Haowei Pan | Xing Xu | Rong Yu | Shun Lan | Yiqian Liu | Haozhi Sha | Nan Feng