Studies of the Origins of Half Loop Arrays and Interfacial Dislocations Observed in Homoepitaxial Layers of 4H-SiC
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Jie Zhang | M. Loboda | G. Chung | M. Dudley | T. A. Venkatesh | B. Raghothamachar | Yu Yang | D. Hansen | S. Mueller | B. Thomas | E. Sanchez | J.Q. Guo | H. Wang | F. Wu