Test method of SOC chip

The invention discloses a test method of an SOC chip. The test method comprises following steps of a: compiling corresponding test programs and initializing test environment; b: loading the test programs to a central processor; c: invoking corresponding systematic functions and generating test affair lists in a system function base according to the loaded test programs via a test data generator; d: testing a to-be-tested SOC chip according to the test affair lists; and e: judging the test covering rate of the to-be-tested SOC chip. According to the invention, via the test method, a verification engineer can well carry out test verification on the SOC chip; the verification engineer does not need to know the specific application of the base hardware; and the system test programs compiled by the verification engineer can be well transplanted in other items, so test progresses are simplified and the test method is highly universal.