论文信息 - Coverage of Si substrates by self-assembling monolayers and multilayers as measured by IR, wettability and X-ray diffraction☆ - 字舞流文

Coverage of Si substrates by self-assembling monolayers and multilayers as measured by IR, wettability and X-ray diffraction☆

A. Segmüller | M. Pomerantz | J. Sagiv | L. Netzer

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