论文信息 - Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al0.08In0.08Ga0.84N thin film assessed by atomic force microscopy and fractal analysis - 字舞流文

Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al0.08In0.08Ga0.84N thin film assessed by atomic force microscopy and fractal analysis

Z. Hassan | A. Ghazai | Ş. Ţălu | S. Stach | Abu Hassan | M. Talu | Ș. Ţălu | A. Hassan | Alaa J. Ghazai | Ș. Țălu