Yaqing Chi

发表

On-Chip Relative Single-Event Transient/Single- Event Upset Susceptibility Test Circuit for Integrated Circuits Working in Real Time

Shuming Chen, Peipei Hao, Zhenyu Wu, 2018, IEEE Transactions on Nuclear Science.

Heavy-Ion-Induced Charge Sharing Measurement With a Novel Uniform Vertical Inverter Chains (UniVIC) SEMT Test Structure

Shuming Chen, Bin Liang, Pengcheng Huang, 2015, IEEE Transactions on Nuclear Science.

MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology

Bin Liang, Jianjun Chen, Yaqing Chi, 2020, IEICE Electronic Express.

Reconfigurable logic gate implemented by suspended-gate single-electron transistors

Liang Fang, Yaqing Chi, Bingcai Sui, 2010, 2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems.

A low contact resistance graphene field effect transistor with single-layer-channel and multi-layer-contact

Liang Fang, Yao Wang, Yaqing Chi, 2014, 2014 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH).

Research on single-event transient mechanism in a novel SOI CMOS technology

Chao Zhang, Hui Yang, Jianjun Chen, 2014, IEICE Electron. Express.

The Effect of Energy Loss Straggling on SEUs Induced by Low-Energy Protons in 28 nm FDSOI SRAMs

Lujie Zhang, Jingyan Xu, Yang Guo, 2019 .

A Programmable Pre-emphasis Transmitter for SerDes in 40 nm CMOS

Sheng Liu, Haiyan Chen, Yaqing Chi, 2017, NCCET.

A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area

Bin Liang, Yaqing Chi, Jianjun Chen, 2019, 2019 IEEE 13th International Conference on ASIC (ASICON).

Characterization of P-hit and N-hit single-event transient using heavy ion microbeam

Bin Liang, Jinjin Shao, Ruiqiang Song, 2019, IEICE Electron. Express.

A Scan Chain Based SEU Test Method for Microprocessors

Bin Liang, Yibai He, Yaqing Chi, 2013, NCCET.

Novel Layout Technique for N-Hit Single-Event Transient Mitigation via Source-Extension

Shuming Chen, Bin Liang, Yibai He, 2012, IEEE Transactions on Nuclear Science.

Novel time redundant flip-flop structure to attenuate the single-event transient

Yaqing Chi, Jianjun Chen, Chunmei Hu, 2016, 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).

Research on the influences of well structure on dose rate effects in 65nm CMOS circuit

Bin Liang, Qian Chen, Jingtian Liu, 2020, IEICE Electron. Express.

Radiation hardness evaluation of the YHFT-DV digital signal processor

Shuming Chen, Yang Guo, Bin Liang, 2017, 2017 IEEE Radiation Effects Data Workshop (REDW).

Analysis of negative differential conductance of single-island single-electron transistors owing to Coulomb oscillations

Chao Zhang, Liang Fang, Yaqing Chi, 2010, IET Circuits Devices Syst..

Full adder designed with MOSFET and single-electron transistor hybrid circuit

Liang Fang, Yaqing Chi, Bingcai Sui, 2010, 2010 Asia Pacific Conference on Postgraduate Research in Microelectronics and Electronics (PrimeAsia).

Investigation of Heavy-Ion Induced Single-Event Transient in 28 nm Bulk Inverter Chain

Bin Liang, Yaqing Chi, Zhenyu Wu, 2020, Symmetry.

Comparison of single-event upset generated by heavy ion and pulsed laser

Bin Liang, Rui Chen, Jianjun Chen, 2016, Science China Information Sciences.

Comprehensive Sensing Current Analysis and Its Guideline for the Worst-Case Scenario of RRAM Read Operation

Yao Wang, Liang Fang, Yaqing Chi, 2018, Electronics.

Modeling the impact of process and operation variations on the soft error rate of digital circuits

Bin Liang, Shuming Chen, Jianjun Chen, 2016, Science China Information Sciences.

Nano-Reconfigurable Cells With Hybrid Circuits of Single-Electron Transistors and MOSFETs

Chao Zhang, Liang Fang, Yaqing Chi, 2010, IEEE Transactions on Electron Devices.

28nm Fault-Tolerant Hardening-by-Design Frequency Divider for Reducing Soft Errors in Clock and Data Recovery

Bin Liang, Xi Chen, Yang Guo, 2019, IEEE Access.

Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs

Bin Liang, Yang Guo, Yaqing Chi, 2019, Symmetry.

Current mirror with charge dissipation transistor for analogue single-event transient mitigation in space application

Li Yan, Yaqing Chi, Jianjun Chen, 2021, IET Circuits Devices Syst..

Macromodeling of realistic single electron transistors for large scale circuit simulation

Chao Zhang, Liang Fang, Yaqing Chi, 2010, 2010 3rd International Nanoelectronics Conference (INEC).

Resistive switching effect in titanium oxides.

Liang Fang, Xun Yi, Yaqing Chi, 2014, Journal of nanoscience and nanotechnology.

Experimental characterization of the bipolar effect on P-hit single-event transients in 65 nm twin-well and triple-well CMOS technologies

Yaqing Chi, Jianjun Chen, Bin Liang, 2016 .

Resistance uniformity of TiO2 memristor with different thin film thickness

Chao Zhang, Liang Fang, Yaqing Chi, 2014, 14th IEEE International Conference on Nanotechnology.

Characterization of Single-Event Transient Pulse Broadening Effect in 65 nm Bulk Inverter Chains Using Heavy Ion Microbeam

Ruiqiang Song, Yaqing Chi, Chunmei Hu, 2017, IEEE Transactions on Nuclear Science.

Experimental characterization of the dominant multiple nodes charge collection mechanism in metal oxide-semiconductor transistors

Shuming Chen, Jingyan Xu, Ruiqiang Song, 2017 .

Characterization of the Effect of Pulse Quenching on Single-Event Transients in 65-nm Twin-Well and Triple-Well CMOS Technologies

Yaqing Chi, Jianjun Chen, Bin Liang, 2018, IEEE Transactions on Device and Materials Reliability.