Design and control of a novel non-raster scan pattern for fast scanning probe microscopy
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F. Allgower | S. O. R. Moheimani | Y. K. Yong | A. Bazaei | F. Allgower | A. Bazaei | Y. Yong | S. Moheimani
[1] K. Leang,et al. Design and Control of a Three-Axis Serial-Kinematic High-Bandwidth Nanopositioner , 2012, IEEE/ASME Transactions on Mechatronics.
[2] Bruce A. Francis,et al. The internal model principle of control theory , 1976, Autom..
[3] M. J. Rost,et al. Scanning probe microscopy at video-rate , 2008 .
[4] S. O. R. Moheimani,et al. Inverse-feedforward of charge-controlled piezopositioners q , qq , 2008 .
[5] Santosh Devasia,et al. Feedback-Linearized Inverse Feedforward for Creep, Hysteresis, and Vibration Compensation in AFM Piezoactuators , 2007, IEEE Transactions on Control Systems Technology.
[6] Hari Singh Nalwa,et al. Handbook of nanostructured materials and nanotechnology , 2000 .
[7] Lukas Novotny,et al. Facts and artifacts in near-field optical microscopy , 1997 .
[8] H. Rothuizen,et al. "Millipede": a MEMS-based scanning-probe data-storage system , 2002, Digest of the Asia-Pacific Magnetic Recording Conference.
[9] B. Bhikkaji,et al. Integral Resonant Control of a Piezoelectric Tube Actuator for Fast Nanoscale Positioning , 2008, IEEE/ASME Transactions on Mechatronics.
[10] Bharath Bhikkaji,et al. A New Scanning Method for Fast Atomic Force Microscopy , 2011, IEEE Transactions on Nanotechnology.
[11] S O Reza Moheimani,et al. Invited review article: accurate and fast nanopositioning with piezoelectric tube scanners: emerging trends and future challenges. , 2008, The Review of scientific instruments.
[12] I. A. Mahmood,et al. Fast spiral-scan atomic force microscopy , 2009, Nanotechnology.
[13] A. Sebastian,et al. Nanopositioning for probe-based data storage [Applications of Control] , 2008, IEEE Control Systems.
[14] S. S. Aphale,et al. High-bandwidth control of a piezoelectric nanopositioning stage in the presence of plant uncertainties , 2008, Nanotechnology.
[15] S. O. Reza Moheimani,et al. A compact XYZ scanner for fast atomic force microscopy in constant force contact mode , 2010, 2010 IEEE/ASME International Conference on Advanced Intelligent Mechatronics.
[16] Sucbei Moon,et al. Semi-resonant operation of a fiber-cantilever piezotube scanner for stable optical coherence tomography endoscope imaging , 2010, Optics express.
[17] T. Ando,et al. High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes , 2008 .
[18] Mark de Berg,et al. Computational geometry: algorithms and applications , 1997 .
[19] Karl Johan Åström,et al. Design and Modeling of a High-Speed AFM-Scanner , 2007, IEEE Transactions on Control Systems Technology.
[20] S O R Moheimani,et al. High-speed cycloid-scan atomic force microscopy , 2010, Nanotechnology.
[21] Gerber,et al. Atomic Force Microscope , 2020, Definitions.
[22] Takeshi Fukuma,et al. High resonance frequency force microscope scanner using inertia balance support , 2008 .
[23] Santosh Devasia,et al. Inverse-feedforward of charge-controlled piezopositioners , 2008 .
[24] Qingze Zou,et al. A review of feedforward control approaches in nanopositioning for high-speed spm , 2009 .
[25] G. Binnig,et al. Scanning tunneling microscopy , 1984 .
[26] Santosh Devasia,et al. A Survey of Control Issues in Nanopositioning , 2007, IEEE Transactions on Control Systems Technology.
[27] Graham C. Goodwin,et al. Control System Design , 2000 .
[28] J L Duerk,et al. Applying the uniform resampling (URS) algorithm to a lissajous trajectory: Fast image reconstruction with optimal gridding , 2000, Magnetic resonance in medicine.