Reconstructing Shapes and Appearances of Thin Film Objects Using RGB Images
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Katsushi Ikeuchi | Imari Sato | Yasuhiro Mukaigawa | Yoshie Kobayashi | Tetsuro Morimoto | Takao Tomono | K. Ikeuchi | Y. Mukaigawa | T. Morimoto | T. Tomono | Imari Sato | Yoshie Kobayashi
[1] Katsushi Ikeuchi,et al. Camera Spectral Sensitivity and White Balance Estimation from Sky Images , 2013, International Journal of Computer Vision.
[2] Berthold K. P. Horn. A problem in computer vision , 1975 .
[3] Mark S. Drew,et al. Deriving Spectra from Colors and Rendering Light Interference , 1999, IEEE Computer Graphics and Applications.
[4] Kristin J. Dana,et al. Device for convenient measurement of spatially varying bidirectional reflectance. , 2004, Journal of the Optical Society of America. A, Optics, image science, and vision.
[5] K. Kitagawa,et al. Transparent film thickness measurement by three-wavelength interference method: An extended application of Global Model Fitting algorithm , 2012, 2012 9th France-Japan & 7th Europe-Asia Congress on Mechatronics (MECATRONICS) / 13th Int'l Workshop on Research and Education in Mechatronics (REM).
[6] Francisco J. Serón,et al. Physically-based simulation of rainbows , 2012, TOGS.
[7] Katsushi Ikeuchi,et al. Determining Shapes of Transparent Objects from Two Polarization Images , 2002, MVA.
[8] Shree K. Nayar,et al. Reflectance and texture of real-world surfaces , 1997, Proceedings of IEEE Computer Society Conference on Computer Vision and Pattern Recognition.
[9] Jason Lawrence,et al. A coaxial optical scanner for synchronous acquisition of 3D geometry and surface reflectance , 2010, ACM Transactions on Graphics.
[10] Kiriakos N. Kutulakos,et al. Reconstructing the Surface of Inhomogeneous Transparent Scenes by Scatter-Trace Photography , 2007, 2007 IEEE 11th International Conference on Computer Vision.
[11] Kazufumi Kaneda,et al. An accurate illumination model for objects coated with multilayer films , 2001, Comput. Graph..
[12] Christian Wöhler,et al. An introduction to image-based 3D surface reconstruction and a survey of photometric stereo methods , 2011 .
[13] Katsushi Ikeuchi,et al. Reconstructing Shape and Appearance of Thin Film Objects with Hyper Spectral Sensor , 2014, ACCV.
[14] Katsuichi Kitagawa,et al. Thin-film thickness profile measurement by three-wavelength interference color analysis. , 2013, Applied optics.
[15] Mark S. Drew,et al. Rendering Iridescent Colors of Optical Disks , 2000, Rendering Techniques.
[16] Yasushi Yagi,et al. Rapid BRDF Measurement Using an Ellipsoidal Mirror and a Projector , 2009, IPSJ Trans. Comput. Vis. Appl..
[17] Terrance E. Boult,et al. Constraining Object Features Using a Polarization Reflectance Model , 1991, IEEE Trans. Pattern Anal. Mach. Intell..
[18] Kazufumi Kaneda,et al. Rendering iridescent colors appearing on natural objects , 2000, Proceedings the Eighth Pacific Conference on Computer Graphics and Applications.
[19] Ramesh Raskar,et al. Reflectance model for diffraction , 2012, TOGS.
[20] K. Ikeuchi,et al. Measurement of surface orientations of transparent objects by use of polarization in highlight , 1999 .
[21] Katsushi Ikeuchi,et al. Transparent surface modeling from a pair of polarization images , 2004 .
[22] Karl Wilh. Meissner. Interference Spectroscopy. Part II , 1941 .